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Simultaneous measurement of Sheet & Hall resistance at high precision and extremely low noise
 

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Want to know how the Tensormeter RTM2 can improve your research?

How to achieve the best possible resistance measurements

Learn about noise reduction and device choices

van der Pauw measurement
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The electrical resistance of materials is one of the properties that is most pervasive in modern applications ranging from nanoscale to megascale. Electrical resistance characterization is a simple, yet powerful tool in diverse fields from the research of new materials, over the qualification of new applications all the way to actual field operation.


To stay ahead of your competition, you want to make the best possible resistance measurements. This means: Get the most precise result in the shortest amount of time. But neither can measurements be infinitely accurate, nor infinitely fast. It is important to understand, which bottlenecks in your signal chain can be resolved and which physical limitations exist.

Follow Tensor Instruments CTO Dr. Tobias Kosub on a tour to

A new dimension of resistance measurements

Don’t hesitate to contact us:

  • to discuss your challenges with your resistance measurements and how the Tensormeter could improve your results.

  • to talk about, how your first sample could be explored with the Tensormeter, while you are attending the measurement live per video-conference (no fees).

  • to find out how you can rent the Tensormeter to explore all its functions and features extensively in your lab.

A single device

for a variety of applications.

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Materials Research

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Magnetic materials

2D materials

Spiontronic materials

Flexible electronics

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Device characterization

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High stability, no drift, no offset

Faster binning

Tighter specs

Integrated calibration

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Unique Measurements

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DC and AC simultaneously

van-der-Pauw, zero-offset Hall

Differential and ratiometric

Harmonic distortion

Pulse and measure

Your benefit

Simpler measurements. Better results.

1

Measure Sheet & Hall resistance at high precision and extremly low noise.

2

Measure irregularly shaped samples without need for lithographic pattern.

3

Replace Lock-in Amplifier, Source/ Measure Unit, Digital Multimeter & Analog Matrix Switch.

4

Save measuring time.

Achieve higher throughput.

Patented Development

The Tensormeter technology is a patented development of

Helmholtz-Zentrum Dresden-Rossendorf e.V.

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